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DFM: The Real 90nm Hurdle
Author(s) -
Robert C. Aitken
Publication year - 2003
Language(s) - English
DOI - 10.1109/itc.2003.10013
Design for Manufacturability (DFM) has always been important, but is vital as we move to 90nm technologies. The line between defects and process variation has blurred to the point that in some cases it is no longer meaningful. This means that yield and quality level are becoming more design dependent than ever, and that test effectiveness cannot be guaranteed without strict DFM guidelines. Without DFM, no company will be able to successfully make the jump to 90nm technology. DFM has historically been most successful in a vertically integrated manufacturing environment; can it succeed in a disaggregated model? The panelists will explore DFM from the foundry, EDA, IP, fabless, and vertically integrated manufacturing perspectives. Can DFM succeed in today’s marketplace, or does it mean the return to vertical integration?

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