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After more than 40 years of evolution, testing has become a very diverse field as broad as electronics itself. Consequently, the test community today must cope with an enormous spectrum of difficult problems ranging from, for instance, logic synthesis for testability to noise and heat dissipation problems in extremely high performance (in reality analog) pin electronics. This level of difficulty is likely to increase even further when the Semiconductor Industry Association (SIA) Roadmap-driven vision for progress in the integrated circuit arena materializes.

New and Not-So-New Test Challenges of the Next Decade