Open AccessIntegrated yield-mining solution with enhanced electrical test data correlation
Author(s) -
Chih-Min Fan,
RueyShan Guo,
A. Chen,
Andre' De Hon,
Wei Jiangfeng,
Mingchu King
Publication year - 2004
Publication title -
ntur (臺灣機構典藏)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1109/issm.2003.1243335
Subject(s) - yield (engineering) , correlation , product (mathematics) , computer science , data mining , process (computing) , volume (thermodynamics) , process engineering , engineering , mathematics , materials science , geometry , metallurgy , physics , quantum mechanics , operating system
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