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Embedded deterministic test is a manufacture test paradigm that combines the compression advantage of built-in self-test with the high fault coverage of deterministic stimuli, inherent to methods based on automatic test pattern generation and external testers. Despite enabling the use of low-cost testers for rapidly achieving high fault coverage, embedded deterministic test must consciously use the available tester channel bandwidth to ensure non-disruptive scaling to future devices of increased complexity. The focus of this paper is to show how exploitation of care bit clustering in a test set combined with a low cost implementation for on-chip decompressors based on seed borrowing, facilitates an increased utilization of the tester channel bandwidth, and hence improved compression of deterministic stimuli.

Embedded Deterministic Test Exploiting Care Bit Clustering and Seed Borrowing