Why Integrated Yield Management is a Necessity
Author(s) -
Y. Lepejian
Publication year - 2002
Language(s) - English
DOI - 10.1109/isqed.2002.10021
Improving semiconductor yield is a multi-facetted process that must include design, manufacturing, and test. An integrated approach enables companies to rapidly reach higher levels of revenue and profitability. Incorporating design-for-yield concepts early, improving the quality of the test programs, and applying new technology to accelerate the measurement and correction of failure sources in the production process combine to have powerful effect upon company profits, product quality, and time to volume.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom