Transient avalanche oscillation of IGBTs under high current
Author(s) -
Tao Hong,
Frank Pfirsch,
Bayerer Reinhold,
Josef Lutz,
Dieter Silber
Publication year - 2014
Publication title -
2014 ieee 26th international symposium on power semiconductor devices and ic's (ispsd)
Language(s) - English
Resource type - Conference proceedings
eISSN - 1946-0201
pISSN - 1063-6854
ISBN - 978-1-4799-2918-4
DOI - 10.1109/ispsd.2014.6855971
Subject(s) - power, energy and industry applications
Under high current, a new type of high frequency oscillation is found during the turn off of 3.3kV IGBTs with trench gate structure. Measurements and simulations indicate that the avalanche generation and transit time effect of carriers within the IGBT leads to this oscillation. The transition time effect takes place during rise of collector voltage at turn-off, especially during the dynamic avalanche phase. The range of frequencies is at several 100 MHz. As the oscillation occurs only transiently, during dynamic avalanche, it is named — Transient Avalanche Oscillation (TA-Oscillation). Both the IMPATT- and PETT-mechanisms are found to be involved in the TA-Oscillation. Detailed investigations of the TA-Oscillation on a special development version of a 3.3kV IGBT led to measures to suppress and avoid such an oscillation. A consequence of preventing this oscillation is proved as an improvement in robustness during turn-off.
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