Robust Sine Wave Fitting in ADC Testing | Zendy

Attila Sárhegyi | Zendy; I. Kollar | Zendy

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Robust Sine Wave Fitting in ADC Testing

Author(s) -

Attila Sárhegyi,

I. Kollar

Publication year - 2006

Publication title -

conference proceedings - ieee instrumentation/measurement technology conference

Language(s) - English

Resource type - Conference proceedings

ISSN - 1091-5281

DOI - 10.1109/imtc.2006.236674

Subject(s) - sine wave , sine , computer science , physics , mathematics , geometry , quantum mechanics , voltage

The IEEE standard 1241-2000 defines ADC testing methods which make use of least squares sine wave fitting algorithms. After sine fitting an error sequence is obtained and this is analyzed in order to determine the properties of the ADC. If the quantization noise dominates in this error sequence, the ADC error analysis may become somewhat misleading. This appears when the amplitude of the test signal is small enough or the amplitude is out of the range of the ADC. In this paper, a new method is proposed and analysed to remedy the above phenomena. Furthermore, the new algorithm is compared with dithering

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