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Handling Geometric Features in Nanoscale Characterization of Charge Injection and Transport in thin Dielectric Films
Author(s) -
Christina Villeneuve-Faure,
Kremena Makasheva,
Laurent Boudou,
G. Teyssèdre
Publication year - 2018
Publication title -
2018 ieee 2nd international conference on dielectrics (icd)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1109/icd.2018.8468409
Subject(s) - electric field , dielectric , materials science , characterization (materials science) , nanoscopic scale , field (mathematics) , thin film , charge (physics) , optoelectronics , nanotechnology , condensed matter physics , optics , physics , mathematics , quantum mechanics , pure mathematics

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