Fault diagnosis of analog circuits by operation-region model and X-Y zoning method

An X-Y zoning method can detect faults of analog circuits by using the relationship between circuit inputs and outputs. An operation-region model can analyze/model circuit behaviors by observing changes in the operation regions of MOS transistors in a circuit. In this paper, we propose a method for diagnosing analog circuits by combining the OR model and the X-Y zoning method A diagnosis procedure is realized by the similar way to the method for digital circuits. In order to demonstrate the effectiveness of the proposed method, we apply the method to ITC'97 benchmark circuits with hard faults and soft faults. We obtained the result that the diagnostic resolution is one for every fault.