Super-resolution via recapture and Bayesian effect modeling
Author(s) -
Nathan Toronto,
B.S. Morse,
K. Seppi,
D. Ventura
Publication year - 2009
Publication title -
2009 ieee conference on computer vision and pattern recognition
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1109/cvprw.2009.5206691
Subject(s) - computer science , artificial intelligence , upsampling , bayesian probability , bayesian inference , inference , boundary (topology) , computer vision , machine learning , mathematics , image (mathematics) , mathematical analysis
This paper presents Bayesian edge inference (BEI), a single-frame super-resolution method explicitly grounded in Bayesian inference that addresses issues common to exist- ing methods. Though the best give excellent results at mod- est magnification factors, they suffer from gradient stepping and boundary coherence problems by factors of 4x. Cen- tral to BEI is a causal framework that allows image cap- ture and recapture to be modeled differently, a principled way of undoing downsampling blur, and a technique for incorporating Markov random field potentials arbitrarily into Bayesian networks. Besides addressing gradient and boundary issues, BEI is shown to be competitive with exist- ing methods on published correctness measures. The model and framework are shown to generalize to other reconstruc- tion tasks by demonstrating BEI's effectiveness at CCD de- mosaicing and inpainting with only trivial changes.
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