Jumping and Refined Local Pattern for Texture Classification
Author(s) -
Tianyu Wang,
Yongsheng Dong,
Chunlei Yang,
Lin Wang,
Lingfei Liang,
Lintao Zheng,
Jiexin Pu
Publication year - 2018
Publication title -
ieee access
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.587
H-Index - 127
ISSN - 2169-3536
DOI - 10.1109/access.2018.2877729
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
The local binary pattern (LBP) model is a simple and effective method of texture classification, but it is sensitive to rotational and noisy images. Although many variants of LBP are proposed by scholars, there are still several urgent problems, such as poor noise and rotation immunity. In this paper, we propose a robust texture descriptor, jumping and refined local pattern (JRLP) for texture classification. In particular, we first extract jumping local difference count pattern (JLDCP) consisting of second-order difference count pattern and diagonal difference count pattern to represent the jumping information in a local domain. To capture the detail information left by JLDCP, we extract a refined completed LBP (RCLBP). By concatenating the JLDCP and RCLBP, we build a JRLP-based robust texture descriptor for classification. Experimental results on four representative texture databases (Brodatz, CUReT, UIUC, and VisTex) reveal that our proposed texture classification method is effective and robust for noise, rotation, scale, and illumination variants and outperforms six representative methods.
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