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Fast Algorithm for Rough-Surface Scene Simulation in Passive Millimeter Wave Imaging
Author(s) -
Chuan Yin,
Youlin Geng,
Yujian Pan,
Huayan Jin
Publication year - 2018
Publication title -
ieee access
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.587
H-Index - 127
ISSN - 2169-3536
DOI - 10.1109/access.2018.2827020
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
Simulation in the passive millimeter-wave (MMW) imaging of rough surfaces is an indispensable step in the simulation in passive radiation imaging. The multi-layer brightness temperature tracing method (MBTTM) can be used to simulate the image of a rough surface, which has been proven in our previous work. However, it causes a significant decrease in efficiency of the simulation. To solve this problem, a fast MBTTM is proposed in this paper. In the new method, the uniformly emission method and multi-layer densification method are presented. To validate the correctness of the new algorithm, the comparison of the simulation and measurement results are proposed. These results are in good agreement, which indicates that the fast MBTTM can notably shorten the computing time of the simulation of the roughsurface scene.

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