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Locating an Acoustic Emission Source in Multilayered Media Based on the Refraction Path Method
Author(s) -
Zilong Zhou,
Yichao Rui,
Jing Zhou,
Longjun Dong,
Xin Cai
Publication year - 2018
Publication title -
ieee access
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.587
H-Index - 127
ISSN - 2169-3536
DOI - 10.1109/access.2018.2805384
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
The traditional acoustic emission (AE) source location method, which is based on the model of a single-layered medium, is not appropriate for accurately locating AE sources in multilayered media. To solve this problem, an innovative AE source location method based on a refraction path (RP) method is proposed. In this new method, the refraction points at each interface are first solved according to Snell's law and then substituted into the equations for the time difference of arrival (TDOA). Second, linear equations can be obtained by linearizing the TDOA equations. Finally, the optimal AE source can be obtained by iteratively updating the trial solution based on the linearized equations. The results of a pencil-lead break experiment and a numerical simulation show that the proposed method is applicable of locating the actual AE source in both the single- and multilayered media, and the location error of this method in multilayered media is significantly smaller than that of the traditional method.

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