Open AccessA Stochastic Flash Analog-to-Digital Converter Linearized by Reference Swapping
Author(s) -
Min-Ki Jeon,
Won-Jun Yoo,
Chan-Gyu Kim,
Changsik Yoo
Publication year - 2017
Publication title -
ieee access
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.587
H-Index - 127
ISSN - 2169-3536
DOI - 10.1109/access.2017.2766671
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
The linearity of a stochastic flash analog-to-digital converter (ADC) with two groups of comparators is improved by reference swapping. If the input offset of a comparator is larger than the linear input range of its comparator group, the reference voltage of the comparator is swapped with the reference voltage of the other comparator group. The reference swapping doubles the number of comparators providing a meaningful result in determining the ADC output. A stochastic flash ADC linearized by the reference swapping has been implemented in a 65-nm CMOS process. The peak signal-to-noise + distortion ratio is 39 dB, which is 3-dB higher than that without the reference swapping.
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