A Survey of the Sensitivities of Security Oriented Flip-Flop Circuits | Zendy

Itamar Levi | Zendy; Netanel Miller | Zendy; Elad Avni | Zendy; Osnat Keren | Zendy; Alexander Fish | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

A Survey of the Sensitivities of Security Oriented Flip-Flop Circuits

Author(s) -

Itamar Levi,

Netanel Miller,

Elad Avni,

Osnat Keren,

Alexander Fish

Publication year - 2017

Publication title -

ieee access

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.587

H-Index - 127

ISSN - 2169-3536

DOI - 10.1109/access.2017.2766243

Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation

Side channel attacks have become a major threat to hardware systems. Most modern digital IC designs utilize sequential elements which dominate the information leakage. This paper reports the first unified analysis and comprehensive comparison of known secure flip-flop circuits. We present a device level analysis of the information leakage from these FFs and propose several evaluation metrics to quantify their security. We show that simulated PA attacks that utilize the information evaluated by these metrics at the gate-level extract more information at the module-level.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research