A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution | Zendy

Muhammad Aslam | Zendy; Osama H. Arif | Zendy; Chi-Hyuck Jun | Zendy

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A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution

Author(s) -

Muhammad Aslam,

Osama H. Arif,

Chi-Hyuck Jun

Publication year - 2017

Publication title -

ieee access

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.587

H-Index - 127

ISSN - 2169-3536

DOI - 10.1109/access.2017.2764953

Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation

In this paper, a new control chart using sudden death testing is designed by assuming that the lifetime/failure time of the product follows the Weibull distribution. The structure of the proposed chart is presented. The control chart coefficient is determined using some specified average run length for the in control process and the shifted process. Simulation study is given for the illustration purpose.

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