Open AccessSensitivity Distribution of CCERT Sensor Under Different Excitation Patterns
Author(s) -
Zhen Xu,
Yandan Jiang,
Baoliang Wang,
Zhiyao Huang,
Haifeng Ji,
Haiqing Li
Publication year - 2017
Publication title -
ieee access
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.587
H-Index - 127
ISSN - 2169-3536
DOI - 10.1109/access.2017.2713834
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
This paper focuses on the study of sensitivity distribution of the capacitively coupled electrical resistance tomography (CCERT) and the influences of excitation patterns on sensitivity distributions. The sensitivity distributions of a 12-electrode CCERT sensor under three excitation patterns (the one-electrode excitation pattern, the three-electrode excitation pattern, and the five-electrode excitation pattern) are investigated and compared. The simulation study was implemented by the COMSOL Multiphysics FEM simulation software and MATLAB. The research results show that there is no negative region in the sensitivity distributions of the CCERT sensor and all the sensitivity distributions are not uniform. The research results also indicate that as the number of excitation electrodes increases, the sensitivity distributions have higher average sensitivity and better distribution uniformity.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom