Multiple Memristor Circuit Parametric Fault Diagnosis Using Feedback-Control Doublet Generator | Zendy

Zhekang Dong | Zendy; Chaoyong Li | Zendy; Donglian Qi | Zendy; Li Luo | Zendy; Shukai Duan | Zendy

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Multiple Memristor Circuit Parametric Fault Diagnosis Using Feedback-Control Doublet Generator

Author(s) -

Zhekang Dong,

Chaoyong Li,

Donglian Qi,

Li Luo,

Shukai Duan

Publication year - 2016

Publication title -

ieee access

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.587

H-Index - 127

ISSN - 2169-3536

DOI - 10.1109/access.2016.2566928

Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation

The memristor was first theorized as an electrical element, which provided the missing link between the charge and the flux. Due to the advantages of nano-scale size, multiple interconnected memristors have demonstrated unique overall characteristics, which are ideal for the utilization in neuromorphic systems. However, compared with the individual memristor circuit, a little work is explored about the overall behavior of the multiple memristive systems. In particular, the lack of a fault diagnosis approach for composite memristive network structures makes all the corresponding applications unstable and shaky. In this paper, the extraordinary properties of multiple memristor circuits are further investigated with comprehensive formula derivation and scientific computer simulations. Furthermore, a special feedback-control doublet generator is designed for implementing the fuzzy-based parametric fault diagnosis of multiple memristor circuits, which offers huge benefits in terms of accuracy and time consumption. Finally, the entire scheme is validated by an illustrative example.

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