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On the Importance of Diffuse Scattering Model Parameterization in Indoor Wireless Channels at mm-Wave Frequencies
Author(s) -
Juan Pascual-Garcia,
Jose-Maria Molina-Garcia-Pardo,
Maria-Teresa Martinez-Ingles,
Jose-Victor Rodriguez,
Noelia Saurin-Serrano
Publication year - 2016
Publication title -
ieee access
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.587
H-Index - 127
ISSN - 2169-3536
DOI - 10.1109/access.2016.2526600
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
In this paper, the impact of considering diffuse multipath components at mm-wave frequencies as well as the significance of selecting appropriate diffuse scattering model parameters is shown. Two different diffuse models, namely, the Lambertian model and the directive model, have been parameterized for several materials typically present in indoor environments. These models are formulated to embed the diffuse scattering phenomenon easily into ray tracing tools. The estimation of the parameters has been performed by comparing measurements and simulations using the models. Once the best fitting parameters have been estimated, they are included in the diffuse components simulation section of a general ray tracing tool. This tool has been used to simulate the power delay profile at 60 GHz in an indoor scenario, including single and double bounce diffuse components. Thanks to the estimated model parameters, the wireless channel at the 60-GHz band can be analyzed, including the diffuse scattering phenomenon, without the need for any previous measurement or simulation. Thus, the channel analysis with ray tracing tools, including dense components, becomes easier, faster, and more reliable.

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