Open AccessX‐ray diffraction with micrometre spatial resolution for highly absorbing samples
Author(s) -
Chakrabarti Prerana,
Wildeis Anna,
Hartmann Markus,
Brandt Robert,
Döhrmann Ralph,
Fevola Giovanni,
Ossig Christina,
Stuckelberger Michael Elias,
Garrevoet Jan,
Falch Ken Vidar,
Galbierz Vanessa,
Falkenberg Gerald,
Modregger Peter
Publication year - 2022
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577522008025
Subject(s) - goniometer , beamline , materials science , optics , image resolution , diffraction , advanced photon source , resolution (logic) , residual stress , beam (structure) , physics , computer science , artificial intelligence , composite material
X‐ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high‐ Z materials by X‐ray fluorescence have been limited due to the utilization of low photon energies. Here, a goniometer‐based setup implemented at the P06 beamline of PETRA III that allows for micrometre spatial resolution with a photon energy of 35 keV and above is reported. A highly focused beam was achieved by using compound refractive lenses, and high‐precision sample manipulation was enabled by a goniometer that allows up to 5D scans (three rotations and two translations). As experimental examples, the determination of local strain variations in martensitic steel samples with micrometre spatial resolution, as well as the simultaneous elemental distribution for high‐ Z materials in a thin‐film solar cell, are demonstrated. The proposed approach allows users from the materials‐science community to determine micro‐structural properties even in highly absorbing samples.