Open AccessStudy of X‐ray topography using the super‐Borrmann effect
Author(s) -
Matsui J.,
Takatsu K.,
Tsusaka Y.
Publication year - 2022
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577522007779
Subject(s) - optics , synchrotron radiation , x ray , attenuation , physics , diffraction , dislocation , beam (structure) , synchrotron , materials science , radiation , condensed matter physics
X‐ray topography exerting the super‐Borrmann effect has been performed using synchrotron radiation to display dislocation images with a high‐speed and high‐resolution CMOS camera. Forward‐transmitted X‐rays are positively employed instead of reflected X‐rays to reveal dislocations in relatively thick crystals by simultaneously exciting a pair of adjacent {111} planes owing to the super‐Borrmann effect. Before the experiment, minimum values of the attenuation coefficients A min P for σ and π polarizations of the incident X‐rays in the three‐beam case are calculated. Results demonstrate that A min P for both polarizations are almost 20 times larger than those in the two‐beam (usual Borrmann effect) case. The transmitted X‐rays can be used to confirm the efficacy of taking topographs under the super‐Borrmann conditions, as well as under multiple‐diffraction conditions. Furthermore, super‐Borrmann topographs can be considered for relatively thick crystals, where a conventional Lang X‐ray topography technique is difficult to apply.