Open AccessMulticolor single‐analyzer high‐energy‐resolution XES spectrometer for simultaneous examination of different elements
Author(s) -
Mikeházi Antal,
El Guettioui Jihad,
Földes István B.,
Vankó György,
Németh Zoltán
Publication year - 2022
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577522007561
Subject(s) - spectrometer , spectrum analyzer , laser , optics , detector , synchrotron , spectroscopy , resolution (logic) , x ray spectroscopy , physics , quantum mechanics , artificial intelligence , computer science
The present work demonstrates the performance of a von Hámos high‐energy‐resolution X‐ray spectrometer based on a non‐conventional conical Si single‐crystal analyzer. The analyzer is tested with different primary and secondary X‐ray sources as well as a hard X‐ray sensitive CCD camera. The spectrometer setup is also characterized with ray‐tracing simulations. Both experimental and simulated results affirm that the conical spectrometer can efficiently detect and resolve the two pairs of two elements (Ni and Cu) K α X‐ray emission spectroscopy (XES) peaks simultaneously, requiring a less than 2 cm‐wide array on a single position‐sensitive detector. The possible applications of this simple yet broad‐energy‐spectrum crystal spectrometer range from quickly adapting it as another probe for complex experiments at synchrotron beamlines to analyzing X‐ray emission from plasma generated by ultrashort laser pulses at modern laser facilities.