Open AccessA new Kirkpatrick–Baez‐based scanning microscope for the Submicron Resolution X‐ray Spectroscopy (SRX) beamline at NSLS‐II
Author(s) -
Nazaretski E.,
Coburn D. S.,
Xu W.,
Ma J.,
Xu H.,
Smith R.,
Huang X.,
Yang Y.,
Huang L.,
Idir M.,
Kiss A.,
Chu Y. S.
Publication year - 2022
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577522007056
Subject(s) - beamline , synchrotron , spectroscopy , resolution (logic) , optics , microscope , materials science , analytical chemistry (journal) , physics , chemistry , computer science , beam (structure) , chromatography , quantum mechanics , artificial intelligence
The development, construction, and first commissioning results of a new scanning microscope installed at the 5‐ID Submicron Resolution X‐ray Spectroscopy (SRX) beamline at NSLS‐II are reported. The developed system utilizes Kirkpatrick–Baez mirrors for X‐ray focusing. The instrument is designed to enable spectromicroscopy measurements in 2D and 3D with sub‐200 nm spatial resolution. The present paper focuses on the design aspects, optical considerations, and specifics of the sample scanning stage, summarizing some of the initial commissioning results.