Open AccessSingle‐exposure X‐ray phase imaging microscopy with a grating interferometer
Author(s) -
Wolf Andreas,
Akstaller Bernhard,
Cipiccia Silvia,
Flenner Silja,
Hagemann Johannes,
Ludwig Veronika,
Meyer Pascal,
Schropp Andreas,
Schuster Max,
Seifert Maria,
Weule Mareike,
Michel Thilo,
Anton Gisela,
Funk Stefan
Publication year - 2022
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s160057752200193x
Subject(s) - optics , phase contrast imaging , interferometry , grating , phase retrieval , phase (matter) , materials science , laser , physics , diffraction grating , image resolution , phase contrast microscopy , quantum mechanics , fourier transform
The advent of hard X‐ray free‐electron lasers enables nanoscopic X‐ray imaging with sub‐picosecond temporal resolution. X‐ray grating interferometry offers a phase‐sensitive full‐field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X‐ray free‐electron lasers where intrinsic pulse‐to‐pulse fluctuations pose a major challenge. In this work, the single‐exposure phase imaging capabilities of grating interferometry are characterized by an implementation at the I13‐1 beamline of Diamond Light Source (Oxfordshire, UK). For comparison purposes, propagation‐based phase contrast imaging was also performed at the same instrument. The characterization is carried out in terms of the quantitativeness and the contrast‐to‐noise ratio of the phase reconstructions as well as via the achievable spatial resolution. By using a statistical image reconstruction scheme, previous limitations of grating interferometry regarding the spatial resolution can be mitigated as well as the experimental applicability of the technique.