Open AccessMultilateral surface analysis of the CeB 6 electron‐gun cathode used at SACLA XFEL
Author(s) -
Ohkochi Takuo,
Muro Takayuki,
Ikenaga Eiji,
Togawa Kazuaki,
Yasui Akira,
Kotsugi Masato,
Oura Masaki,
Tanaka Hitoshi
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577521009656
Subject(s) - thermionic emission , synchrotron radiation , electron , cathode , atomic physics , spectroscopy , photoemission spectroscopy , materials science , hot cathode , electron microscope , electron gun , scanning electron microscope , x ray photoelectron spectroscopy , optics , chemistry , physics , cathode ray , nuclear magnetic resonance , quantum mechanics
The CeB 6 (001) single crystal used as a cathode in a low‐emittance electron gun and operated at the free‐electron laser facility SACLA was investigated using cathode lens electron microscopy combined with X‐ray spectroscopy at SPring‐8 synchrotron radiation facility. Multilateral analysis using thermionic emission electron microscopy, low‐energy electron microscopy, ultraviolet and X‐ray photoemission electron microscopy and hard X‐ray photoemission spectroscopy revealed that the thermionic electrons are emitted strongly and evenly from the CeB 6 surface after pre‐activation treatment (annealing at 1500°C for >1 h) and that the thermionic emission intensity as well as elemental composition vary between the central area and the edge of the old CeB 6 surface.