Open AccessThe finer things in X‐ray diffraction data collection
Author(s) -
Pflugrath J. W.
Publication year - 1999
Publication title -
acta crystallographica section d
Language(s) - English
Resource type - Journals
ISSN - 1399-0047
DOI - 10.1107/s090744499900935x
Subject(s) - mosaicity , diffraction , pixel , optics , software suite , position (finance) , detector , suite , rotation (mathematics) , software , x ray , physics , materials science , x ray crystallography , computer science , computer vision , geography , archaeology , finance , economics , programming language
X‐ray diffraction images from two‐dimensional position‐sensitive detectors can be characterized as thick or thin, depending on whether the rotation‐angle increment per image is greater than or less than the crystal mosaicity, respectively. The expectations and consequences of the processing of thick and thin images in terms of spatial overlap, saturated pixels, X‐ray background and I /σ( I ) are discussed. The d*TREK software suite for processing diffraction images is briefly introduced, and results from d*TREK are compared with those from another popular package.