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Information-driven inverse approach to disordered solids: Applications to amorphous silicon
Author(s) -
Dil K. Limbu,
Raymond AttaFynn,
D. A. Drabold,
Stephen R. Elliott,
Parthapratim Biswas
Publication year - 2018
Publication title -
physical review materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.439
H-Index - 42
eISSN - 2476-0455
pISSN - 2475-9953
DOI - 10.1103/physrevmaterials.2.115602
Subject(s) - reverse monte carlo , materials science , amorphous silicon , raman spectroscopy , silicon , amorphous solid , diffraction , neutron diffraction , inverse , statistical physics , relaxation (psychology) , crystalline silicon , condensed matter physics , crystallography , physics , optics , mathematics , chemistry , optoelectronics , geometry , social psychology , psychology
Dil K. Limbu,1,* Raymond Atta-Fynn,2,† David A. Drabold,3,‡ Stephen R. Elliott,4,§ and Parthapratim Biswas1,‖ 1Department of Physics and Astronomy, The University of Southern Mississippi, Hattiesburg, Mississippi 39406, USA 2Department of Physics, University of Texas, Arlington, Texas 76019, USA 3Department of Physics and Astronomy, Ohio University, Athens, Ohio 45701, USA 4Department of Chemistry, University of Cambridge, Cambridge CB2 1EW, United Kingdom

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