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Identification of the Carbon Antisite-Vacancy Pair in4H-SiC
Author(s) -
T. Umeda,
Nguyên Tiên Són,
Junichi Isoya,
Erik Janzén,
Takeshi Ohshima,
N. Morishita,
H. Itoh,
Ádám Gali,
Michel Bockstedte
Publication year - 2006
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.96.145501
Subject(s) - metastability , vacancy defect , center (category theory) , charge (physics) , materials science , carbon fibers , electron paramagnetic resonance , crystallography , semiconductor , physics , atomic physics , condensed matter physics , nuclear magnetic resonance , chemistry , particle physics , quantum mechanics , optoelectronics , composite number , composite material
The metastability of vacancies was theoretically predicted for several compound semiconductors alongside their transformation into the antisite-vacancy pair counterpart; however, no experiment to date has unambiguously confirmed the existence of antisite-vacancy pairs. Using electron paramagnetic resonance and first principles calculations we identify the SI5 center as the carbon antisite-vacancy pair in the negative charge state (CSiVC-) in 4H-SiC. We suggest that this defect is a strong carrier-compensating center in n-type or high-purity semi-insulating SiC

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