Opacity Effect on Extreme Ultraviolet Radiation from Laser-Produced Tin Plasmas
Author(s) -
Shinsuke Fujioka,
Hiroaki Nishimura,
Katsunobu Nishihara,
Akira Sasaki,
Atsushi Sunahara,
T. Okuno,
Nobuyoshi Ueda,
Tsuyoshi Andô,
Yezheng Tao,
Yoshinori Shimada,
Kazuhisa Hashimoto,
Michiteru Yamaura,
K. Shigemori,
M. Nakai,
Keiji Nagai,
T. Norimatsu,
Takeshi Nishikawa,
N. Miyanaga,
Yasukazu Izawa,
K. Mima
Publication year - 2005
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.95.235004
Subject(s) - extreme ultraviolet lithography , opacity , extreme ultraviolet , plasma , laser , materials science , tin , radiation , wavelength , optics , ultraviolet , energy conversion efficiency , optoelectronics , physics , metallurgy , quantum mechanics
Opacity effects on extreme ultraviolet (EUV) emission from laser-produced tin (Sn) plasma have been experimentally investigated. An absorption spectrum of a uniform Sn plasma generated by thermal x rays has been measured in the EUV range (9-19 nm wavelength) for the first time. Experimental results indicate that control of the optical depth of the laser-produced Sn plasma is essential for obtaining high conversion to 13.5 nm-wavelength EUV radiation; 1.8% of the conversion efficiency was attained with the use of 2.2 ns laser pulses.
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