Open AccessQuantum Process Tomography of a Controlled-NOT Gate
Author(s) -
Jeremy L. O’Brien,
Geoff J. Pryde,
Alexei Gilchrist,
Daniel F. V. James,
Nathan K. Langford,
Timothy C. Ralph,
A. G. White
Publication year - 2004
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.93.080502
Subject(s) - controlled not gate , process (computing) , tomography , quantum process , qubit , matrix (chemical analysis) , gate equivalent , physics , characterization (materials science) , algorithm , quantum gate , quantum circuit , computer science , quantum , optics , quantum mechanics , materials science , gate oxide , quantum error correction , voltage , transistor , quantum dynamics , composite material , operating system
We demonstrate complete characterization of a two-qubit entangling process -a linear optics controlled-NOT gate operating with coincident detection - byquantum process tomography. We use maximum-likelihood estimation to convert theexperimental data into a physical process matrix. The process matrix allowsaccurate prediction of the operation of the gate for arbitrary input states,and calculation of gate performance measures such as the average gate fidelity,average purity and entangling capability of our gate, which are 0.90, 0.83 and0.73, respectively.Comment: 4 pages, 2 figures. v2 contains new data corresponding to improved gate operation. Figure quality slightly reduced for arXi
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