Open AccessComplete Characterization of Arbitrary Quantum Measurement Processes
Author(s) -
Alfredo Luis,
L. L. Sánchez-Soto
Publication year - 1999
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.83.3573
Subject(s) - quantum , characterization (materials science) , simple (philosophy) , physics , parity (physics) , theoretical physics , computer science , quantum mechanics , statistical physics , optics , philosophy , epistemology
We examine two simple and feasible practical schemes allowing the complete determination of any quantum measuring arrangement. This is illustrated with the example of parity measurement
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