Field-Induced Deformation as a Mechanism for Scanning Tunneling Microscopy Based Nanofabrication | Zendy

Ole Hansen | Zendy; Jan Tue Ravnkilde | Zendy; Ulrich J. Quaade | Zendy; Kurt Stokbro | Zendy; F. Grey | Zendy

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Field-Induced Deformation as a Mechanism for Scanning Tunneling Microscopy Based Nanofabrication

Author(s) -

Ole Hansen,

Jan Tue Ravnkilde,

Ulrich J. Quaade,

Kurt Stokbro,

F. Grey

Publication year - 1998

Publication title -

physical review letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.688

H-Index - 673

eISSN - 1079-7114

pISSN - 0031-9007

DOI - 10.1103/physrevlett.81.5572

Subject(s) - scanning tunneling microscope , materials science , deformation (meteorology) , nanolithography , quantum tunnelling , electric field , condensed matter physics , field (mathematics) , finite element method , stress (linguistics) , scanning probe microscopy , optics , mechanics , nanotechnology , composite material , optoelectronics , physics , fabrication , thermodynamics , medicine , alternative medicine , mathematics , pathology , quantum mechanics , pure mathematics , linguistics , philosophy

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