Scanning Motions of an Atomic Force Microscope Tip in Water | Zendy

Kenichiro Koga | Zendy; Xiao Cheng Zeng | Zendy

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Scanning Motions of an Atomic Force Microscope Tip in Water

Author(s) -

Kenichiro Koga,

Xiao Cheng Zeng

Publication year - 1997

Publication title -

physical review letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.688

H-Index - 673

eISSN - 1079-7114

pISSN - 0031-9007

DOI - 10.1103/physrevlett.79.853

Subject(s) - substrate (aquarium) , materials science , atomic force microscopy , conductive atomic force microscopy , trajectory , monolayer , molecule , scanning probe microscopy , non contact atomic force microscopy , microscope , layering , nanotechnology , molecular physics , optics , physics , quantum mechanics , astronomy , geology , oceanography , botany , biology

Integral equation techniques are used to study scanning motions of a single-atom tip of the atomic force microscope (AFM) over a rigid, hydrophobic monolayer substrate in water. The calculated force curve is found to be oscillatory, in agreement with recent AFM experiments, which can lead to multiple scanning trajectories for the tip under a constant load. The unique trajectory along which the system is thermodynamically stable is revealed. This study shows that the tip may take a hopping motion over a defect-free substrate due to layering of water molecules between the tip and substrate. (S0031-9007(97)03741-1)

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