Normal Displacements on a Reconstructed Silicon (111) Surface: An X-Ray-Standing-Wave Study | Zendy

J. R. Patel | Zendy; P. E. Freeland | Zendy; J. A. Golovchenko | Zendy; A. R. Kortan | Zendy; D. J. Chadi | Zendy; Guo -Xin Qian | Zendy

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Normal Displacements on a Reconstructed Silicon (111) Surface: An X-Ray-Standing-Wave Study

Author(s) -

J. R. Patel,

P. E. Freeland,

J. A. Golovchenko,

A. R. Kortan,

D. J. Chadi,

Guo -Xin Qian

Publication year - 1986

Publication title -

physical review letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.688

H-Index - 673

eISSN - 1079-7114

pISSN - 0031-9007

DOI - 10.1103/physrevlett.57.3077

Subject(s) - silicon , surface (topology) , stacking , crystal (programming language) , x ray , physics , atom (system on chip) , atomic physics , germanium , displacement (psychology) , materials science , surface reconstruction , relaxation (psychology) , energy (signal processing) , molecular physics , optics , geometry , nuclear magnetic resonance , optoelectronics , quantum mechanics , psychology , social psychology , mathematics , computer science , embedded system , psychotherapist , programming language

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