X-Ray Reflectivity from the Surface of a Liquid Crystal: Surface Structure and Absolute Value of Critical Fluctuations | Zendy

P. S. Pershan | Zendy; J. AlsNielsen | Zendy

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X-Ray Reflectivity from the Surface of a Liquid Crystal: Surface Structure and Absolute Value of Critical Fluctuations

Author(s) -

P. S. Pershan,

J. AlsNielsen

Publication year - 1984

Publication title -

physical review letters

Language(s) - French

Resource type - Journals

SCImago Journal Rank - 3.688

H-Index - 673

eISSN - 1079-7114

pISSN - 0031-9007

DOI - 10.1103/physrevlett.52.759

Subject(s) - optics , fresnel equations , reflection (computer programming) , superposition principle , total internal reflection , scattering , surface (topology) , bragg's law , materials science , liquid crystal , intensity (physics) , crystal (programming language) , fresnel number , total external reflection , reflectivity , physics , refractive index , diffraction , geometry , quantum mechanics , mathematics , computer science , programming language

La reflectivite RX de la surface d'un cristal liquide nematique est interpretee comme la superposition coherente de la reflexion de Fresnel en surface et celle de Bragg due a l'ordre smectique induit par la surface

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