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Physical Mechanisms and Scaling Laws ofK-Shell Double Photoionization
Author(s) -
J. Hoszowska,
A. S. Kheifets,
J.Cl. Dousse,
M. Berset,
Igor Bray,
Wei Cao,
K. Fennane,
Yves Kayser,
M. Kavčič,
Jakub Szlachetko,
M. Szlachetko
Publication year - 2009
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.102.073006
Subject(s) - photoionization , physics , atomic physics , shell (structure) , electron , l shell , electron shell , ion , charge (physics) , radiative transfer , photon , photon energy , nuclear physics , ionization , particle physics , materials science , quantum mechanics , earth's magnetic field , magnetic field , composite material
We report on the photon energy dependence of the K-shell double photoionization (DPI) of Mg, Al, and Si. The DPI cross sections were derived from high-resolution measurements of x-ray spectra following the radiative decay of the K-shell double vacancy states. Our data evince the relative importance of the final-state electron-electron interaction to the DPI. By comparing the double-to-single K-shell photoionization cross-section ratios for neutral atoms with convergent close-coupling calculations for He-like ions, the effect of outer shell electrons on the K-shell DPI process is assessed. Universal scaling of the DPI cross sections with the effective nuclear charge for neutral atoms is revealed.

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