Breakdown Limits on Gigavolt-per-Meter Electron-Beam-Driven Wakefields in Dielectric Structures
Author(s) -
M. C. Thompson,
H. Badakov,
Alan M. Cook,
J. B. Rosenzweig,
R. Tikhoplav,
G. Travish,
I. Blumenfeld,
Mark Hogan,
R. Ischebeck,
Neil Kirby,
R. Siemann,
D. Walz,
P. Muggli,
A. Scott,
R. B. Yoder
Publication year - 2008
Publication title -
physical review letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.688
H-Index - 673
eISSN - 1079-7114
pISSN - 0031-9007
DOI - 10.1103/physrevlett.100.214801
Subject(s) - dielectric , cathode ray , electric field , electron , dielectric strength , beam (structure) , materials science , atomic physics , range (aeronautics) , optics , physics , optoelectronics , nuclear physics , composite material , quantum mechanics
First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330 fs), 28.5 GeV electron bunches have been made. Fused silica tubes of 100 {micro}m inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27 GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8 {+-} 0.7 GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques
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