z-logo
open-access-imgOpen Access
Surface anchoring structure of a liquid crystal monolayer studied via dual polarization interferometry
Author(s) -
Osbert Zheng Tan,
Graham H. Cross
Publication year - 2009
Publication title -
physical review e
Language(s) - English
Resource type - Journals
eISSN - 1550-2376
pISSN - 1539-3755
DOI - 10.1103/physreve.79.021703
Subject(s) - anchoring , liquid crystal , materials science , monolayer , interferometry , polarization (electrochemistry) , dual (grammatical number) , dual polarization interferometry , surface (topology) , optics , condensed matter physics , optoelectronics , nanotechnology , physics , geometry , chemistry , mathematics , telecommunications , computer science , antenna (radio) , art , literature , structural engineering , engineering
The self-organization of liquid crystal molecules of 4-n-pentyl-4′-cyanobiphenyl (5CB) forming an oriented monolayer by condensation from the vapor phase onto a silicon oxynitride surface has been observed using the evanescent wave dual slab waveguide dual polarization mode interferometry (DPI) technique. Two distinct stages to the layer formation are observed: After the formation of a layer of molecules lying prone on the surface, further condensation begins to densify the layer and produces a gradual mutual alignment of the molecules until the fully condensed, fully aligned monolayer is reached. At this limit the full coverage 5CB monolayer on this surface and at a temperature of 25 °C, is found to be anchored with an average molecular axis polar angle of 56±1° and with a measured thickness of 16.6±0.5 Å. These results are in reasonable agreement with the molecular dimensions provided by molecular models. The apparent precision and accuracy of these results resolves some wide disparity between earlier studies of such systems. Previous difficulties in determining optogeometrical properties of such ultrathin birefringent films using ellipsometry or in the need for complex modeling of the film layer structure using x-ray reflectivity are overcome in this instance. We provide a technique for analyzing the dual polarization data from DPI such that the bulk refractive index values, when known, can be used to determine the orientation and thickness of a layer that is on the nanometer or subnanometer scale.\ud\u

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom