Capillary wave fluctuations and intrinsic widths of coupled fluid-fluid interfaces: An x-ray scattering study of a wetting film on bulk liquid | Zendy

Masafumi Fukuto | Zendy; Oleg Gang | Zendy; Kyle J. Alvine | Zendy; P. S. Pershan | Zendy

Open Access

Capillary wave fluctuations and intrinsic widths of coupled fluid-fluid interfaces: An x-ray scattering study of a wetting film on bulk liquid

Author(s) -

Masafumi Fukuto,

Oleg Gang,

Kyle J. Alvine,

P. S. Pershan

Publication year - 2006

Publication title -

physical review e

Language(s) - English

Resource type - Journals

eISSN - 1550-2376

pISSN - 1539-3755

DOI - 10.1103/physreve.74.031607

Subject(s) - scattering , specular reflection , wetting , capillary wave , capillary action , physics , condensed matter physics , small angle scattering , optics , materials science , surface finish , thermodynamics , surface wave , composite material

An x-ray specular reflectivity (XR) and off-specular diffuse scattering (XDS) study of the coupled thermal capillary fluctuations and the intrinsic profiles of two interacting fluid-fluid interfaces is presented. The measurements are carried out on complete wetting films of perfluoromethylcyclohexane (PFMC) on the surface of bulk liquid eicosane (C20), as a function of film thickness 30infinity), determined by either the radius of gyration (5.3 A) or the bulk correlation length (4.8 A) of the alkane C20. The intrinsic liquid-vapor interfacial width is sharper (approximately 2 A) and remains essentially constant over the entire probed range of D .

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research