Open AccessEdge dislocation in a vertical smectic-A film: Line tension versus temperature and film thickness near the nematic phase
Author(s) -
Andrzej Żywociński,
Frédéric Picano,
P. Oswald,
JeanChristophe Géminard
Publication year - 2000
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
DOI - 10.1103/physreve.62.8133·
Subject(s) - liquid crystal , materials science , condensed matter physics , enhanced data rates for gsm evolution , phase (matter) , line (geometry) , dislocation , tension (geology) , optics , composite material , chemistry , physics , geometry , mathematics , ultimate tensile strength , telecommunications , computer science , organic chemistry