Open AccessNoncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical properties
Author(s) -
Franck Bocquet,
Laurent y,
Franck Para,
Philipda Luangprasert,
JeanValère Naubron,
Christian Loppacher,
Thomas Leoni,
Anthony Thomas,
Alain Ranguis,
Anthony D’Aléo,
Fréderic Fagès,
C. Becker
Publication year - 2018
Publication title -
physical review. b./physical review. b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.78
H-Index - 465
eISSN - 2469-9969
pISSN - 2469-9950
DOI - 10.1103/physrevb.97.235434
Subject(s) - spectroscopy , materials science , chemical physics , molecule , characterization (materials science) , optics , chemistry , molecular physics , nanotechnology , organic chemistry , physics , quantum mechanics
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