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Electronic structure of self-doped layeredEu3F4Bi2S4material revealed by x-ray absorption spectroscopy and photoelectron spectromicroscopy
Author(s) -
E. Paris,
T. Sugimoto,
Takanori Wakita,
Alexei Barinov,
Kensei Terashima,
Viktor Kandyba,
Olivier Proux,
Joe Kajitani,
Ryuji Higashinaka,
Tatsuma D. Matsuda,
Yuji Aoki,
T. Yokoya,
T. Mizokawa,
N. L. Saini
Publication year - 2017
Publication title -
physical review. b./physical review. b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.78
H-Index - 465
eISSN - 2469-9969
pISSN - 2469-9950
DOI - 10.1103/physrevb.95.035152
Subject(s) - angle resolved photoemission spectroscopy , x ray absorption spectroscopy , valence (chemistry) , electronic structure , photoemission spectroscopy , physics , xanes , crystallography , doping , phase diagram , condensed matter physics , materials science , spectroscopy , absorption spectroscopy , x ray photoelectron spectroscopy , phase (matter) , chemistry , nuclear magnetic resonance , quantum mechanics

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