Critical thickness for interface misfit dislocation formation in two-dimensional materials | Zendy

Brian C. McGuigan | Zendy; Pascal Pochet | Zendy; Harley T. Johnson | Zendy

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Critical thickness for interface misfit dislocation formation in two-dimensional materials

Author(s) -

Brian C. McGuigan,

Pascal Pochet,

Harley T. Johnson

Publication year - 2016

Publication title -

physical review. b./physical review. b

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.78

H-Index - 465

eISSN - 2469-9969

pISSN - 2469-9950

DOI - 10.1103/physrevb.93.214103

Subject(s) - heterojunction , materials science , dislocation , graphene , condensed matter physics , limiting , boron nitride , lattice (music) , nanotechnology , composite material , optoelectronics , physics , mechanical engineering , acoustics , engineering

Brian C. McGuigan,1 Pascal Pochet,2,3,* and Harley T. Johnson1,2,† 1Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA 2Université Grenoble-Alpes, Grenoble 38000, France 3Atomistic Simulation Laboratory (L_Sim), CEA, INAC F-38054, Grenoble 38000, France (Received 14 February 2016; revised manuscript received 12 May 2016; published 6 June 2016)

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