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Complex crystallization dynamics in amorphous germanium observed with dynamic transmission electron microscopy
Author(s) -
L. Nikolova,
Thomas LaGrange,
Mark J. Stern,
Jennifer MacLeod,
Bryan W. Reed,
Heide Ibrahim,
Geoffrey H. Campbell,
Federico Rosei,
Bradley J. Siwick
Publication year - 2013
Publication title -
physical review b
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.87.064105
Subject(s) - microsecond , crystallization , nanosecond , materials science , transmission electron microscopy , germanium , temporal resolution , amorphous solid , chemical physics , laser , crystallography , optics , nanotechnology , optoelectronics , chemistry , physics , thermodynamics , silicon
Crystallization of amorphous germanium (a-Ge) by laser or electron beam heating is a remarkably complex process that involves several distinct modes of crystal growth and the development of intricate microstructural patterns on the nanosecond to ten microsecond time scales. Here we use dynamic transmission electron microscopy (DTEM) to study the fast, complex crystallization dynamics with 10 nm spatial and 15 ns temporal resolution. We have obtained time-resolved real-space images of nanosecond laser-induced crystallization in a-Ge with unprecedentedly high spatial resolution. Direct visualization of the crystallization front allows for time-resolved snapshots of the initiation and roughening of the dendrites on submicrosecond time scales. This growth is followed by a rapid transition to a ledgelike growth mechanism that produces a layered microstructure on a time scale of several microseconds. This study provides insights into the mechanisms governing this complex crystallization process and is a dramatic demonstration of the power of DTEM for studying time-dependent material processes far from equilibrium

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