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Structural coupling across the LaAlO3/SrTiO3interface: High-resolution x-ray diffraction study
Author(s) -
Jos E. Boschker,
C. M. Folkman,
Chung Wung Bark,
Å. F. Monsen,
Erik Folven,
J. K. Grepstad,
Erik Wahlström,
ChangBeom Eom,
Thomas Tybell
Publication year - 2011
Publication title -
physical review b
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.84.205418
Subject(s) - diffraction , materials science , thin film , substrate (aquarium) , x ray crystallography , lattice (music) , condensed matter physics , optics , coupling (piping) , resolution (logic) , crystallography , physics , nanotechnology , chemistry , oceanography , acoustics , artificial intelligence , computer science , metallurgy , geology
J. E. Boschker,1 C. Folkman,2 C. W. Bark,2 A. F. Monsen,3 E. Folven,1 J. K. Grepstad,1 E. Wahlstrom,3 C. B. Eom,2 and T. Tybell1,* 1Department of Electronics and Telecommunications, Norwegian University of Science and Technology, 7491 Trondheim, Norway 2Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA 3Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway (Received 9 August 2011; revised manuscript received 6 October 2011; published 14 November 2011)

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