Continuous spin reorientation transition in epitaxial antiferromagnetic NiO thin films | Zendy

J. Li | Zendy; Elke Arenholz | Zendy; Yang Meng | Zendy; A. Tan | Zendy; Andrew J. Park | Zendy; Eric N. Jin | Zendy; Ho Sung Son | Zendy; J. Wu | Zendy; Catherine Jenkins | Zendy; A. Schöll | Zendy; H. W. Zhao | Zendy; Chanyong Hwang | Zendy; Z. Q. Qiu | Zendy

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Continuous spin reorientation transition in epitaxial antiferromagnetic NiO thin films

Author(s) -

J. Li,

Elke Arenholz,

Yang Meng,

A. Tan,

Andrew J. Park,

Eric N. Jin,

Ho Sung Son,

J. Wu,

Catherine Jenkins,

A. Schöll,

H. W. Zhao,

Chanyong Hwang,

Z. Q. Qiu

Publication year - 2011

Publication title -

physical review b

Language(s) - English

Resource type - Journals

eISSN - 1538-4489

pISSN - 1098-0121

DOI - 10.1103/physrevb.84.012406

Subject(s) - antiferromagnetism , spins , non blocking i/o , condensed matter physics , materials science , epitaxy , spin (aerodynamics) , thin film , layer (electronics) , physics , nanotechnology , chemistry , biochemistry , thermodynamics , catalysis

Fe/NiO/MgO/Ag(001) films were grown epitaxially, and the Fe and NiO spin orientations were determined using x-ray magnetic dichroism. We find that the NiO spins are aligned perpendicularly to the in-plane Fe spins. Analyzing both the in-plane and out-of-plane spin components of the NiO layer, we demonstrate unambiguously that the antiferromagnetic NiO spins undergo a continuous spin reorientation transition from the in-plane to out-of-plane directions with increasing of the MgO thickness

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