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Ionization energy of donor and acceptor impurities in semiconductor nanowires: Importance of dielectric confinement
Author(s) -
Mamadou Diarra,
Yann-Michel Niquet,
Christophe Delerue,
G. Allan
Publication year - 2007
Publication title -
physical review b
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.75.045301
Subject(s) - nanowire , impurity , acceptor , materials science , dielectric , ionization , nonmetal , semiconductor , doping , condensed matter physics , atomic physics , ionization energy , ion , nanotechnology , metal , optoelectronics , physics , quantum mechanics , metallurgy
Calculations of the electronic states of donor and acceptor impurities in nanowires show that the ionization energy of the impurities is strongly enhanced with respect to the bulk, above all when the wires are embedded in a material with a low dielectric constant. In free-standing nanowires with diameter below $10\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$, the ionization of the impurities at $300\phantom{\rule{0.3em}{0ex}}\mathrm{K}$ is strongly reduced and heavy doping is necessary to obtain conductive systems. These results imply that the critical density for metal-nonmetal transitions is not the same as in the bulk. Experiments are proposed to test the predictions.

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