Picosecond soft x-ray absorption measurement of the photoinduced insulator-to-metal transition inVO2 | Zendy

A. Cavalleri | Zendy; Henry Chong | Zendy; S. Fourmaux | Zendy; T. E. Glover | Zendy; P.A. Heimann | Zendy; J. C. Kieffer | Zendy; Bongjin Simon Mun | Zendy; H. A. Padmore | Zendy; R. W. Schoenlein | Zendy

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Picosecond soft x-ray absorption measurement of the photoinduced insulator-to-metal transition inVO2

Author(s) -

A. Cavalleri,

Henry Chong,

S. Fourmaux,

T. E. Glover,

P.A. Heimann,

J. C. Kieffer,

Bongjin Simon Mun,

H. A. Padmore,

R. W. Schoenlein

Publication year - 2004

Publication title -

physical review b

Language(s) - English

Resource type - Journals

eISSN - 1538-4489

pISSN - 1098-0121

DOI - 10.1103/physrevb.69.153106

Subject(s) - picosecond , materials science , ultrashort pulse , absorption edge , vanadium , redshift , absorption (acoustics) , analytical chemistry (journal) , optics , physics , band gap , optoelectronics , laser , chemistry , astrophysics , galaxy , chromatography , metallurgy , composite material

We directly measure the photoinduced insulator-to-metal transition in VO2 using time-resolved near-edge x-ray absorption. Picosecond pulses of synchrotron radiation are used to detect the redshift in the vanadium L3edge at 516 eV, which is associated with the transient collapse of the low-temperature band gap. We identify a two-component temporal response, corresponding to an ultrafast transformation over a 50 nm surface layer, followed by 40 m/s thermal growth of the metallic phase into the bulk.

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