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Guest displacement in silicon clathrates
Author(s) -
Florent Tournus,
Bruno Masenelli,
P. Méli,
Damien Connétable,
Xavier Blase,
A.M. Flank,
P. Lagarde,
C. Cros,
Michel Pouchard
Publication year - 2004
Publication title -
physical review b
Language(s) - English
Resource type - Journals
eISSN - 1538-4489
pISSN - 1098-0121
DOI - 10.1103/physrevb.69.035208
Subject(s) - clathrate hydrate , silicon , materials science , atom (system on chip) , crystallography , rietveld refinement , sodium , symmetry (geometry) , displacement (psychology) , condensed matter physics , crystal structure , physics , hydrate , chemistry , optoelectronics , psychology , geometry , mathematics , organic chemistry , computer science , psychotherapist , metallurgy , embedded system
International audienceWe study both theoretically and experimentally the structure doped silicon clathrate II NaxSi34..

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