Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system | Zendy

M. Ali | Zendy; C. H. Marrows | Zendy; Maisoon AlJawad | Zendy; B. J. Hickey | Zendy; A. Misra | Zendy; U. Nowak | Zendy; K. D. Usadel | Zendy

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Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

Author(s) -

M. Ali,

C. H. Marrows,

Maisoon AlJawad,

B. J. Hickey,

A. Misra,

U. Nowak,

K. D. Usadel

Publication year - 2003

Publication title -

physical review. b, condensed matter

Language(s) - English

Resource type - Journals

eISSN - 1095-3795

pISSN - 0163-1829

DOI - 10.1103/physrevb.68.214420

Subject(s) - exchange bias , antiferromagnetism , condensed matter physics , biasing , coercivity , materials science , field (mathematics) , field dependence , layer (electronics) , magnetic field , magnetic anisotropy , physics , magnetization , nanotechnology , voltage , mathematics , quantum mechanics , pure mathematics

A study of exchange bias in Irmn/Co systems is presented. Temperature and thickness dependence studies have revealed nonmonotonic behavior in both exchange bias field and coercivity with both variables. In particular the exchange bias field shows a peak for low IrMn thicknesses that is suppressed at temperatures higher than about 200 K. Calculations using the domain state model of exchange biasing are able to describe all the features seen in the experimental data.

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